Digital Circuit Testing: A Guide to DFT and Other Techniques - Tapa dura

Wang, Francis C.; Wong, Francis C.

 
9780127345802: Digital Circuit Testing: A Guide to DFT and Other Techniques
Tapa dura
ISBN 10: 0127345809 ISBN 13: 9780127345802
Editorial: Academic Press, 1991

Sinopsis

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

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Críticas

"The text, Digital Circuit Testing: A Guide to DFT and Other Techniques, introduces the reader to the whole spectrum of digital test technology, covering some facets in more detail than others....This book is intended to be an introduction to straight-forward testing techniques, easily applicable to the daily work of design and test engineers or as a course or reference text. The author accomplishes his purpose succinctly and in an easy-to-understand style."
--IEEE, INSTRUMENTATION AND MEASUREMENT SOCIETY NEWSLETTER

Reseña del editor

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Academic Press
Año de publicación
1991
Idioma
Inglés
ISBN 10 
0127345809
ISBN 13 
9780127345802
Encuadernación
Tapa dura
Número de páginas
248
Contacto del fabricante
Elsevier GmbH
https://www.elsevier.com/

Jägerstraße 41
Berlin
Berlin
10117
Alemania

Otras ediciones populares con el mismo título

9780123959126: Digital Circuit Testing: A Guide to DFT and Other Techniques

Edición Destacada

ISBN 10:  0123959128 ISBN 13:  9780123959126
Editorial: Academic Press, 2016
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