In an area of ever increasing interest, this volume comprises the invited papers from well known and respected workers in the field. It covers the characterization of thin films using a variety of techniques including scanning electron microscopy, scanning tunnelling microscopy, transmission electron microscopy, x-ray diffraction and electron probe microanalysis.
The main applications of this specialized field in sensors, hard coatings and microelectronics are discussed.

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Diagnostics and Applications of Thin Films: Proceedings of the International Summer School, 27th May-5Th June 1991, Chlum U Trebone, Czechoslovakia

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