Diagnostics and Applications of Thin Films, Proceedings of the INT Summer School, May 1991, Czechoslovakia - Tapa dura
Sinopsis
In an area of ever increasing interest, this volume comprises the invited papers from well known and respected workers in the field. It covers the characterization of thin films using a variety of techniques including scanning electron microscopy, scanning tunnelling microscopy, transmission electron microscopy, x-ray diffraction and electron probe microanalysis. The main applications of this specialized field in sensors, hard coatings and microelectronics are discussed.
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Reseña del editor
In an area of ever increasing interest, this volume comprises the invited papers from well known and respected workers in the field. It covers the characterization of thin films using a variety of techniques including scanning electron microscopy, scanning tunnelling microscopy, transmission electron microscopy, x-ray diffraction and electron probe microanalysis.
The main applications of this specialized field in sensors, hard coatings and microelectronics are discussed.
Reseña del editor
The results of a summer school held in Czechoslovakia are contained in this volume, which explores the characterization of thin films using techniques such as scanning tunnelling microscopy, X-ray microanalysis and transmission electron microscopy, as well as specific applications of thin films, including hard coatings and sensors.
"Sobre este título" puede pertenecer a otra edición de este libro.
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Diagnostics and Applications of Thin Films: Proceedings of the International Summer School, 27th May-5Th June 1991, Chlum U Trebone, Czechoslovakia
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United Kingdom: Inst of Physics Pub Inc, 1992
ISBN 10: 0750301651
ISBN 13: 9780750301657
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Diagnostics and Applications of Thin Films, Proceedings of the INT Summer School, May 1991, Czechoslovakia
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Diagnostics and Applications of Thin Films
Publicado por
Institute of Physics, Bristol, England, 1992
ISBN 10: 0750301651
ISBN 13: 9780750301657
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Hard Cover. Condición: New. New condition. 314pp. Illustrated. Proceedings of the International Summer School May 27-June 5 1991, Czechoslovakia. Papers presented include the characterization of thin films using techniques such as scanning tunnelling microscopy, x-ray microanalysis, transmission electron microscopy, applications of thin films in coatings and sensors, industrial film thickness measurements and methods, SIMS of thin films, Fourier transform of lattices, structural surface measurements by backscattered electrons, EELS, and more. Nº de ref. del artículo: S12-000904
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Diagnostics and Applications of Thin Films: Proceedings of the International Summer School, 27th May-5Th June 1991, Chlum U Trebone, Czechoslovakia
Publicado por
Institute of Physics Publishing, 1992
ISBN 10: 0750301651
ISBN 13: 9780750301657
Antiguo o usado
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