Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale - Tapa dura

 
9789535104148: Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale
Tapa dura
ISBN 10: 9535104144 ISBN 13: 9789535104148
Editorial: IntechOpen, 2012

Sinopsis

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

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Editorial
IntechOpen
Año de publicación
2012
Idioma
Inglés
ISBN 10 
9535104144
ISBN 13 
9789535104148
Encuadernación
Tapa dura
Número de páginas
270
Editor
Bellitto Victor
Contacto del fabricante
no disponible
Persona responsable
no disponible