Artículos relacionados a Functional Design Errors in Digital Circuits: Diagnosis...
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering) - Tapa blanda
Sinopsis
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
"Sinopsis" puede pertenecer a otra edición de este libro.
Acerca del autor
Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors
De la contraportada
Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
"Sobre este título" puede pertenecer a otra edición de este libro.
- EditorialSpringer
- Año de publicación2010
- ISBN 10 9048181127
- ISBN 13 9789048181124
- EncuadernaciónTapa blanda
- IdiomaInglés
- Número de páginas224
- Contacto del fabricanteno disponible
Comprar nuevo
Ver este artículo
EUR 129,93
EUR 4,65 gastos de envío desde Reino Unido a España
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Functional Design Errors in Digital Circuits: Diagnosis...
Imagen de archivo
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32)
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9789048181124_new
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Functional Design Errors in Digital Circuits
Publicado por
Springer Netherlands, 2010
ISBN 10: 9048181127
ISBN 13: 9789048181124
Nuevo
Tapa blanda
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage of novel techniques to automate IC debugging, a subject rarely covered in other booksComprehensive scope and solutions: from RTL to post-silicon debuggingThe innovative techniques covered in this book are recent and have been featu. Nº de ref. del artículo: 5821942
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Functional Design Errors in Digital Circuits
Publicado por
Springer Netherlands Okt 2010, 2010
ISBN 10: 9048181127
ISBN 13: 9789048181124
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. 224 pp. Englisch. Nº de ref. del artículo: 9789048181124
Cantidad disponible: 2 disponibles
Imagen del vendedor
Functional Design Errors in Digital Circuits : Diagnosis Correction and Repair
Publicado por
Springer Netherlands, Springer Netherlands, 2010
ISBN 10: 9048181127
ISBN 13: 9789048181124
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. Nº de ref. del artículo: 9789048181124
Cantidad disponible: 1 disponibles
Imagen del vendedor
Functional Design Errors in Digital Circuits
Publicado por
Springer Netherlands, Springer Netherlands Okt 2010, 2010
ISBN 10: 9048181127
ISBN 13: 9789048181124
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 224 pp. Englisch. Nº de ref. del artículo: 9789048181124
Cantidad disponible: 1 disponibles
Imagen de archivo
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32)
Librería: California Books, Miami, FL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: I-9789048181124
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Functional Design Errors in Digital Circuits
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 226. Nº de ref. del artículo: 263070685
Cantidad disponible: 4 disponibles
Imagen de archivo
Functional Design Errors in Digital Circuits
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Print on Demand pp. 226 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam. Nº de ref. del artículo: 5858562
Cantidad disponible: 4 disponibles
Imagen de archivo
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32)
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: ABLIING23Apr0316110339192
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Functional Design Errors in Digital Circuits
Impresión bajo demandaLibrería: Biblios, Frankfurt am main, HESSE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. PRINT ON DEMAND pp. 226. Nº de ref. del artículo: 183070679
Cantidad disponible: 4 disponibles