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Foundation and application of scanning electron microscopy and electron probe(Chinese Edition)
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Shanghai Science and Technology Pub. Date :2009-12-01 version 1, 2000
ISBN 10: 7532399915
ISBN 13: 9787532399918
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Librería: liu xing, Nanjing, JS, China
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: New. HardCover Pub Date: December 2009 Pages: 206 Language: Chinese in Publisher: Shanghai Science and Technology Press. the foundation and application of scanning electron microscopy and electron probe through research instance. introduced a scanning electron microscope and electron probe in materials research. especially in the study of inorganic non-metallic materials. The book is divided into seven chapters. the content involves scanning electron microscopy and electron probe and scanning elec. Nº de ref. del artículo: CC012030
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