ISBN: 9787532399918 - scanning electron microscopy and electron probe of basic and applied (refined)(chinese edition) (1 resultados)
Idioma: Inglés
Editorial: Shanghai Science and Technology Pub. Date :2009-12-01 version 1, 2000
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Librería: liu xing, Nanjing, JS, Chinaliu xing
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EUR 71,94
Envío por EUR 16,07Se envía de China a Estados Unidos de AmericaCantidad disponible: 1 disponible
Hardcover. Condición: New. HardCover Pub Date: December 2009 Pages: 206 Language: Chinese in Publisher: Shanghai Science and Technology Press. the foundation and application of scanning electron microscopy and electron probe through research instance. introduced a scanning electron microscope and electron probe in materials research. especially in the study of inorganic non-metallic materials. The book is divided into seven chapters. the content involves scanning electron microscopy and electron probe and scanning elec.…
