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Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology) - Tapa dura
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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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Scanning Probe Microscopy
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Springer Berlin Heidelberg, 2015
ISBN 10: 3662452391
ISBN 13: 9783662452394
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Librería: moluna, Greven, Alemania
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Condición: New. Nº de ref. del artículo: 20937848
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Scanning Probe Microscopy
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2015, 2015
ISBN 10: 3662452391
ISBN 13: 9783662452394
Nuevo
Tapa dura
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. 400 pp. Englisch. Nº de ref. del artículo: 9783662452394
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Scanning Probe Microscopy
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2015, 2015
ISBN 10: 3662452391
ISBN 13: 9783662452394
Nuevo
Tapa dura
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 400 pp. Englisch. Nº de ref. del artículo: 9783662452394
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Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2015
ISBN 10: 3662452391
ISBN 13: 9783662452394
Nuevo
Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. Nº de ref. del artículo: 9783662452394
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EUR 63,82
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Cantidad disponible: 1 disponibles