Sinopsis
X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.
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De la contraportada
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained.
To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
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X-RAY DIFFRACTION CRYSTALLOGRAPHY
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X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems
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X-ray Diffraction Crystallography : Introduction, Examples and Solved Problems
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X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems
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X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems
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X-Ray Diffraction Crystallography
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Springer Berlin Heidelberg, 2014
ISBN 10: 3642442552
ISBN 13: 9783642442551
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Tutorial-like scientific monograph on X-ray diffraction analysisSummarizes the complete knowledge on X-Ray diffraction crystallography and structure analysis of crystals for researchers and graduate studentsPresents the crystallographic bas. Nº de ref. del artículo: 11801080
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X-Ray Diffraction Crystallography (Paperback)
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2014
ISBN 10: 3642442552
ISBN 13: 9783642442551
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Paperback. Condición: new. Paperback. X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements. X-ray diffraction crystallography for powder samples is a well-established and widely used method. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9783642442551
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X-Ray Diffraction Crystallography
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2014, 2014
ISBN 10: 3642442552
ISBN 13: 9783642442551
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements. 324 pp. Englisch. Nº de ref. del artículo: 9783642442551
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X-Ray Diffraction Crystallography | Introduction, Examples and Solved Problems
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Springer-Verlag GmbH, 2014
ISBN 10: 3642442552
ISBN 13: 9783642442551
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Taschenbuch. Condición: Neu. X-Ray Diffraction Crystallography | Introduction, Examples and Solved Problems | Yoshio Waseda (u. a.) | Taschenbuch | xi | Englisch | 2014 | Springer-Verlag GmbH | EAN 9783642442551 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Nº de ref. del artículo: 104913867
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X-Ray Diffraction Crystallography
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2014, 2014
ISBN 10: 3642442552
ISBN 13: 9783642442551
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Taschenbuch. Condición: Neu. Neuware -X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 324 pp. Englisch. Nº de ref. del artículo: 9783642442551
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