Image Analysis in Earth Sciences: Microstructures and Textures of Earth Materials: 129 (Lecture Notes in Earth Sciences) - Tapa dura

Barrett, Steve; Heilbronner, Renée

 
9783642103421: Image Analysis in Earth Sciences: Microstructures and Textures of Earth Materials: 129 (Lecture Notes in Earth Sciences)
Tapa dura
ISBN 10: 3642103421 ISBN 13: 9783642103421
Editorial: Springer-Verlag GmbH, 2013

Sinopsis

Image Analysis in Earth Sciences is a graduate level textbook for researchers and students interested in the quantitative microstructure and texture analysis of earth materials.

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Acerca del autor

Professor Renee Heilbronner has many years of experience in the field of image analysis and has developed several software packages, including a method for texture determination using light optical methods and general orientation imaging. She was involved in the development of an internationally renowned free-ware image analysis program (Image SXM, former NIH Image), and is a member of a growing group of international texture analysis experts who are setting up workshops and building a network for texture research involving mathematicians, material scientists, and geologists. As an experienced teacher of image analysis at different levels ranging from general introductory courses to specialized texture workshops, she has taught at various universities all over the world.

De la contraportada

Image Analysis in Earth Sciences is a graduate level textbook for researchers and students interested in the quantitative microstructure and texture analysis of earth materials. Methods of analysis and applications are introduced using carefully worked examples. The input images are typically derived from earth materials, acquired at a wide range of scales, through digital photography, light and electron microscopy. The book focuses on image acquisition, pre- and post-processing, on the extraction of objects (segmentation), the analysis of volumes and grain size distributions, on shape fabric analysis (particle and surface fabrics) and the analysis of the frequency domain (FFT and ACF). The last chapters are dedicated to the analysis of crystallographic fabrics and orientation imaging. Throughout the book the free software Image SXM is used.

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Editorial
Springer-Verlag GmbH
Año de publicación
2013
Idioma
Inglés
ISBN 10 
3642103421
ISBN 13 
9783642103421
Encuadernación
Tapa dura
Número de páginas
539
Contacto del fabricante
Springer Nature Customer Service Center GmbH
ProductSafety@springernature.com

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Heidelberg
69115
Alemania

Otras ediciones populares con el mismo título

9783642103643: Image Analysis in Earth Sciences: Microstructures and Textures of Earth Materials

Edición Destacada

ISBN 10:  3642103642 ISBN 13:  9783642103643
Editorial: Springer, 2013
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