Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Tapa blanda
Sinopsis
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
"Sinopsis" puede pertenecer a otra edición de este libro.
Críticas
From the reviews:
"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the study of probe methods. ... Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. ... All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
“The articles ... are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. ... SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications ... . well-written and clearly illustrated. ... contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)Reseña del editor
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
"Sobre este título" puede pertenecer a otra edición de este libro.
Otras ediciones populares con el mismo título
Resultados de la búsqueda para Applied Scanning Probe Methods XI: Scanning Probe Microscopy...
Imagen de archivo
Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology)
Librería: Phatpocket Limited, Waltham Abbey, HERTS, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions. Nº de ref. del artículo: Z1-C-018-03067
Comprar usado
EUR 88,28
Gastos de envío:
EUR 12,11
De Reino Unido a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen del vendedor
Applied Scanning Probe Methods XI
Publicado por
Springer Berlin Heidelberg, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
Nuevo
Tapa blanda
Librería: moluna, Greven, Alemania
Calificación del vendedor: 4 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedOscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evapora. Nº de ref. del artículo: 5048861
Comprar nuevo
EUR 98,54
Gastos de envío:
EUR 48,99
De Alemania a Estados Unidos de America
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Applied Scanning Probe Methods XI
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. liv + 236. Nº de ref. del artículo: 263064392
Comprar nuevo
EUR 155,83
Gastos de envío:
EUR 3,47
A Estados Unidos de America
Cantidad disponible: 4 disponibles
Imagen del vendedor
Applied Scanning Probe Methods XI | Scanning Probe Microscopy Techniques
Librería: preigu, Osnabrück, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Applied Scanning Probe Methods XI | Scanning Probe Microscopy Techniques | Harald Fuchs (u. a.) | Taschenbuch | lvi | Englisch | 2010 | Springer Berlin | EAN 9783642098697 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Nº de ref. del artículo: 107175256
Comprar nuevo
EUR 102,90
Gastos de envío:
EUR 70,00
De Alemania a Estados Unidos de America
Cantidad disponible: 5 disponibles
Imagen de archivo
Applied Scanning Probe Methods XI
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 4 de 5 estrellas
Condición: New. Print on Demand pp. liv + 236. Nº de ref. del artículo: 5864855
Comprar nuevo
EUR 166,96
Gastos de envío:
EUR 7,40
De Reino Unido a Estados Unidos de America
Cantidad disponible: 4 disponibles
Imagen de archivo
Applied Scanning Probe Methods XI
Impresión bajo demandaLibrería: Biblios, Frankfurt am main, HESSE, Alemania
Calificación del vendedor: 4 de 5 estrellas
Condición: New. PRINT ON DEMAND pp. liv + 236. Nº de ref. del artículo: 183064386
Comprar nuevo
EUR 166,56
Gastos de envío:
EUR 9,95
De Alemania a Estados Unidos de America
Cantidad disponible: 4 disponibles
Imagen del vendedor
Applied Scanning Probe Methods XI
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -¿The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. ¿ This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information¿knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2¿4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch. Nº de ref. del artículo: 9783642098697
Comprar nuevo
EUR 117,69
Gastos de envío:
EUR 60,00
De Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen del vendedor
Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques
Publicado por
Springer Berlin Heidelberg, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth. Nº de ref. del artículo: 9783642098697
Comprar nuevo
EUR 117,69
Gastos de envío:
EUR 62,23
De Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen de archivo
Applied Scanning Probe Methods: Scanning Probe Microscopy Techniques: Vol 11
Librería: Revaluation Books, Exeter, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: Brand New. 236 pages. 8.90x6.00x0.80 inches. In Stock. Nº de ref. del artículo: 364209869X
Comprar nuevo
EUR 176,38
Gastos de envío:
EUR 11,38
De Reino Unido a Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen del vendedor
Applied Scanning Probe Methods XI
Publicado por
Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth. 292 pp. Englisch. Nº de ref. del artículo: 9783642098697
Comprar nuevo
EUR 181,89
Gastos de envío:
EUR 23,00
De Alemania a Estados Unidos de America
Cantidad disponible: 2 disponibles