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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Tapa blanda
Sinopsis
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
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Críticas
From the reviews:
"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the study of probe methods. ... Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. ... All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)
“The articles ... are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. ... SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications ... . well-written and clearly illustrated. ... contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)Reseña del editor
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology)
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Condición: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions. Nº de ref. del artículo: Z1-C-018-03067
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Applied Scanning Probe Methods XI
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Springer Berlin Heidelberg, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedOscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evapora. Nº de ref. del artículo: 5048861
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Applied Scanning Probe Methods XI : Scanning Probe Microscopy Techniques
Publicado por
Springer Berlin Heidelberg, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth. Nº de ref. del artículo: 9783642098697
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Applied Scanning Probe Methods XI
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -¿The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. ¿ This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information¿knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2¿4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch. Nº de ref. del artículo: 9783642098697
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Applied Scanning Probe Methods XI
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Applied Scanning Probe Methods XI
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Applied Scanning Probe Methods: Scanning Probe Microscopy Techniques: Vol 11
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Applied Scanning Probe Methods XI
Publicado por
Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 364209869X
ISBN 13: 9783642098697
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth. 292 pp. Englisch. Nº de ref. del artículo: 9783642098697
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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology)
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