Sinopsis
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.
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Reseña del editor
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.
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Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)
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Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)
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Applied Scanning Probe Methods VI
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Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 3642072127
ISBN 13: 9783642072123
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications. 384 pp. Englisch. Nº de ref. del artículo: 9783642072123
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Applied Scanning Probe Methods VI
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Springer Berlin Heidelberg, 2010
ISBN 10: 3642072127
ISBN 13: 9783642072123
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedThe first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing s. Nº de ref. del artículo: 5046290
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Applied Scanning Probe Methods VI
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Applied Scanning Probe Methods VI | Characterization
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Taschenbuch. Condición: Neu. Applied Scanning Probe Methods VI | Characterization | Satoshi Kawata (u. a.) | Taschenbuch | xlv | Englisch | 2010 | Springer Spektrum | EAN 9783642072123 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Nº de ref. del artículo: 107211397
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Applied Scanning Probe Methods VI
Publicado por
Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2010, 2010
ISBN 10: 3642072127
ISBN 13: 9783642072123
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 384 pp. Englisch. Nº de ref. del artículo: 9783642072123
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Applied Scanning Probe Methods VI
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
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Applied Scanning Probe Methods VI : Characterization
Publicado por
Springer Berlin Heidelberg, 2010
ISBN 10: 3642072127
ISBN 13: 9783642072123
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging. Nº de ref. del artículo: 9783642072123
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Applied Scanning Probe Methods VI: Characterization (Nanoscience and Technology)
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Paperback. Condición: Brand New. 383 pages. 9.25x6.10x0.87 inches. In Stock. Nº de ref. del artículo: x-3642072127
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