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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications: 85 (Springer Series in Materials Science) - Tapa blanda
Sinopsis
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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Acerca del autor
10/99 "Gustav-Mie-Preis" awarded for the diploma thesis by the Faculty of Physics at Albert-Ludwigs-University Freiburg
09/99 – 05/04 PhD thesis in physics at Fraunhofer ISE and University of Konstanz:
"Lifetime spectroscopy as a method of defect characterization in silicon for photovoltaic applications" (overall grade: summa cum laude)
08/95 – 01/97 Undergraduate assistant at Fraunhofer ISE in the area of solar cell
characterization
12/98 – 08/99 Research assistant at Fraunhofer ISE
1. in the department of solar cells – materials – technology
2. in the department of thermal optical systems
06/04 – today Research assistant at Fraunhofer ISE
De la contraportada
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
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Lifetime Spectroscopy
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Springer Berlin Heidelberg Okt 2010, 2010
ISBN 10: 3642064531
ISBN 13: 9783642064531
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. 520 pp. Englisch. Nº de ref. del artículo: 9783642064531
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Lifetime Spectroscopy
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
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Lifetime Spectroscopy (Paperback)
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Paperback. Condición: new. Paperback. Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9783642064531
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
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Lifetime Spectroscopy
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Springer Berlin Heidelberg, Springer Berlin Heidelberg Okt 2010, 2010
ISBN 10: 3642064531
ISBN 13: 9783642064531
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Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 520 pp. Englisch. Nº de ref. del artículo: 9783642064531
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Lifetime Spectroscopy
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2010
ISBN 10: 3642064531
ISBN 13: 9783642064531
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Condición: New. Series: Springer Series in Materials Science. Num Pages: 518 pages, 29 black & white tables, biography. BIC Classification: PHFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 26. Weight in Grams: 722. . 2010. 1st ed. Softcover of orig. ed. 2005. Paperback. . . . . Nº de ref. del artículo: V9783642064531
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
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Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2010
ISBN 10: 3642064531
ISBN 13: 9783642064531
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. Nº de ref. del artículo: 9783642064531
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