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X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149 (Springer Tracts in Modern Physics) - Tapa dura

Libro 59 de 227: Springer Tracts in Modern Physics

Holy, V.; Pietsch, U.; Baumbach, T.

 
9783540620297: X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films: Vol 149 (Springer Tracts in Modern Physics)

Sinopsis

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.

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Reseña del editor

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

"Sobre este título" puede pertenecer a otra edición de este libro.