This is the 5th edition of the International Conference on Integrated Formal Methods (IFM). Previous IFM conferences were held in York (June 1999), D- stuhl (November 2000), Turku (May 2002) and Canterbury (April 2004). This year’s IFM was held in December 2005 on the campus of the Technische Univ- siteit Eindhoven in The Netherlands. This year IFM received 40 submissions, from which 19 high-quality papers wereselectedbytheProgramCommittee.Besidesthese,theproceedingscontain invited contributions by Patrice Godefroid, David Parnas and Doron Peled. It was 10 years ago that Jonathan P. Bowen and Michael G. Hinchey p- lished their famous Ten Commandments of Formal Methods in IEEE Computer 28(4). Their very ?rst commandment - Thou shalt choose an appropriate - tation - touches the heart of the IFM theme: Complex systems have di?erent aspects, and each aspect requires its own appropriate notation. Classical examples of models for various aspects are: state based notations andalgebraicdatatypesfordata,processalgebrasandtemporallogicsforbeh- ior, duration calculus and timed automata for timing aspects, etc. The central question is how the models of di?erent notations relate. Recently, Bowen and Hinchey presented their Ten Commandments Revisited (in: ACM proceedings of the 10th InternationalWorkshop on Formal Methods for Industrial Critical S- tems). Theydistinghuishvariationsin combiningnotations,rangingfromloosely coupled viewpoints to integrated methods. Thelooselycoupledviewpointsarequitepopular(cf.thesuccessofUML)and are easy to adopt in a leightweight process. They could be useful for specifying and analyzing isolated system aspects. However, the main advantage of formal methods - being able to specify and verify the correctness of complete systems -islost.
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This is the 5th edition of the International Conference on Integrated Formal Methods (IFM). Previous IFM conferences were held in York (June 1999), D- stuhl (November 2000), Turku (May 2002) and Canterbury (April 2004). This year's IFM was held in December 2005 on the campus of the Technische Univ- siteit Eindhoven in The Netherlands. This year IFM received 40 submissions, from which 19 high-quality papers wereselectedbytheProgramCommittee.Besidesthese,theproceedingscontain invited contributions by Patrice Godefroid, David Parnas and Doron Peled. It was 10 years ago that Jonathan P. Bowen and Michael G. Hinchey p- lished their famous Ten Commandments of Formal Methods in IEEE Computer 28(4). Their very ?rst commandment - Thou shalt choose an appropriate - tation - touches the heart of the IFM theme: Complex systems have di?erent aspects, and each aspect requires its own appropriate notation. Classical examples of models for various aspects are: state based notations andalgebraicdatatypesfordata,processalgebrasandtemporallogicsforbeh- ior, duration calculus and timed automata for timing aspects, etc. The central question is how the models of di?erent notations relate. Recently, Bowen and Hinchey presented their Ten Commandments Revisited (in: ACM proceedings of the 10th InternationalWorkshop on Formal Methods for Industrial Critical S- tems). Theydistinghuishvariationsin combiningnotations,rangingfromloosely coupled viewpoints to integrated methods. Thelooselycoupledviewpointsarequitepopular(cf.thesuccessofUML)and are easy to adopt in a leightweight process. They could be useful for specifying and analyzing isolated system aspects. However, the main advantage of formal methods - being able to specify and verify the correctness of complete systems -islost.
This book constitutes the refereed proceedings of the 5th International Conference on Integrated Formal Methods, IFM 2005, held in Eindhoven, The Netherlands, in November/December 2005.
The 19 revised full papers presented together with 3 invited papers were carefully reviewed and selected from 40 submissions. The papers are organized in topical sections on components, state/event-based verification, system development, applications of B, tool support, non-software domains, semantics, as well as UML and statecharts.
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This is the 5th edition of the International Conference on Integrated Formal Methods (IFM). Previous IFM conferences were held in York (June 1999), D- stuhl (November 2000), Turku (May 2002) and Canterbury (April 2004). This year s IFM was held in December 2005 on the campus of the Technische Univ- siteit Eindhoven in The Netherlands. This year IFM received 40 submissions, from which 19 high-quality papers wereselectedbytheProgramCommittee.Besidesthese,theproceedings contain invited contributions by Patrice Godefroid, David Parnas and Doron Peled. It was 10 years ago that Jonathan P. Bowen and Michael G. Hinchey p- lished their famous Ten Commandments of Formal Methods in IEEE Computer 28(4). Their very rst commandment Thou shalt choose an appropriate - tation touches the heart of the IFM theme: Complex systems have di erent aspects, and each aspect requires its own appropriate notation. Classical examples of models for various aspects are: state based notations andalgebraicdatatypesfordata,processalgebrasandtemporallogicsforbeh- ior, duration calculus and timed automata for timing aspects, etc. The central question is how the models of di erent notations relate. Recently, Bowen and Hinchey presented their Ten Commandments Revisited (in: ACM proceedings of the 10th InternationalWorkshop on Formal Methods for Industrial Critical S- tems). Theydistinghuishvariationsin combiningnotations,rangingfromloosely coupled viewpoints to integrated methods. Thelooselycoupledviewpointsarequitepopular(cf.thesuccessofUML)and are easy to adopt in a leightweight process. They could be useful for specifying and analyzing isolated system aspects. However, the main advantage of formal methods being able to specify and verify the correctness of complete systems islost. 424 pp. Englisch. Nº de ref. del artículo: 9783540304920
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Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the 5th edition of the International Conference on Integrated Formal Methods (IFM). Previous IFM conferences were held in York (June 1999), D- stuhl (November 2000), Turku (May 2002) and Canterbury (April 2004). This year s IFM was held in December 2005 on the campus of the Technische Univ- siteit Eindhoven in The Netherlands. This year IFM received 40 submissions, from which 19 high-quality papers wereselectedbytheProgramCommittee.Besidesthese,theproceedingscontain invited contributions by Patrice Godefroid, David Parnas and Doron Peled. It was 10 years ago that Jonathan P. Bowen and Michael G. Hinchey p- lished their famous Ten Commandments of Formal Methods in IEEE Computer 28(4). Their very rst commandment Thou shalt choose an appropriate - tation touches the heart of the IFM theme: Complex systems have di erent aspects, and each aspect requires its own appropriate notation. Classical examples of models for various aspects are: state based notations andalgebraicdatatypesfordata,processalgebrasandtemporallogicsforbeh- ior, duration calculus and timed automata for timing aspects, etc. The central question is how the models of di erent notations relate. Recently, Bowen and Hinchey presented their Ten Commandments Revisited (in: ACM proceedings of the 10th InternationalWorkshop on Formal Methods for Industrial Critical S- tems). Theydistinghuishvariationsin combiningnotations,rangingfromloosely coupled viewpoints to integrated methods. Thelooselycoupledviewpointsarequitepopular(cf.thesuccessofUML)and are easy to adopt in a leightweight process. They could be useful for specifying and analyzing isolated system aspects. However, the main advantage of formal methods being able to specify and verify the correctness of complete systems islost. Nº de ref. del artículo: 9783540304920
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Condición: New. Constitutes the proceedings of the 5th International Conference on Integrated Formal Methods, IFM 2005, held in November/December 2005. The papers are organized in topical sections on components, state/event-based verification, system development, applications of B, tool support, non-software domains, semantics, as well as UML and statecharts. Editor(s): Romijn, Judi M.T. (Eindhoven University of Technology); Smith, Graeme P. (Eindhoven University of Technology); Pol, Jaco C. van de (Centre for Mathematics and Computer Science (CWI)). Series: Lecture Notes in Computer Science / Programming and Software Engineering. Num Pages: 407 pages, biography. BIC Classification: UYA. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 21. Weight in Grams: 1310. . 2005. 2005th Edition. paperback. . . . . Nº de ref. del artículo: V9783540304920
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