Artículos relacionados a Powder Diffraction: The Rietveld Method and the Two...
Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data - Tapa dura
Sinopsis
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination.
Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
"Sinopsis" puede pertenecer a otra edición de este libro.
Acerca del autor
Georg Will studied physics and crystallography a the Technische Hochschule München. In 1961 he moved to the USA, where he worked at the Brook National Laboratory, where in collaboration with Walter Hamilton the idea was born to analyse crystal structure from powder diffraction data using a POWLS program. A decisive step forward came in the 1980's when he worked with Bill Parrish at the IBM Research Laboratory in San José, California. At that time the "two stage method" was developed to its present state, beginning the analysis of computer based profile fitting followed by least squares refinements and Fourier methods.
He returned to Germany in 1965 and to Bonn in 1969, where he concentrated on neuron diffraction for the study of crystal and magnetic strucutres using the "two stage method".The "Rietveld method" was also applied, although it was only useful for limited and some well defined problems. Later he extended his interest to in-situ high pressure diffraction with synchroton radiation. In 1990 with the newly developed position-sensitive detector JULIOS, diffraction experiments were started at the spallation source ISIS in England. Through the simultaneous recording of angles and energies, this detector in combination with the "two stage method" gave a specific advantage in studying powders as well as single crystals (Laue diffraction) with spallation source neutrons.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 81,94
EUR 63,73 gastos de envío desde Estados Unidos de America a España
Destinos, gastos y plazos de envíoComprar nuevo
Ver este artículo
EUR 100,44
EUR 16,99 gastos de envío desde Estados Unidos de America a España
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Powder Diffraction: The Rietveld Method and the Two...
Imagen del vendedor
Powder Diffraction : The Rietveld Method And the Two-Stage Method To Determine And Refine Crystal Structures From Powder Diffraction Data
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 4046266-n
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9783540279853_new
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
Librería: Best Price, Torrance, CA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. SUPER FAST SHIPPING. Nº de ref. del artículo: 9783540279853
Cantidad disponible: 2 disponibles
Imagen del vendedor
Powder Diffraction : The Rietveld Method And the Two-Stage Method To Determine And Refine Crystal Structures From Powder Diffraction Data
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 4046266-n
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Powder Diffraction
Publicado por
Springer Berlin Heidelberg, 2005
ISBN 10: 3540279857
ISBN 13: 9783540279853
Nuevo
Tapa dura
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. An important relatively new field of application is in texture analysisGeorg Will studied physics and crystallography a the Technische Hochschule Muenchen. In 1961 he moved to the USA, where he worked at the Brook National Laboratory, where in collabo. Nº de ref. del artículo: 4886910
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Powder Diffraction
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. 236. Nº de ref. del artículo: 26296000
Cantidad disponible: 4 disponibles
Imagen de archivo
Powder Diffraction
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Print on Demand pp. 236 Illus. Nº de ref. del artículo: 7551903
Cantidad disponible: 4 disponibles
Imagen de archivo
Powder Diffraction: The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
Publicado por
Springer (edition 2006), 2005
ISBN 10: 3540279857
ISBN 13: 9783540279853
Antiguo o usado
Tapa dura
Librería: BooksRun, Philadelphia, PA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Good. 2006. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience. Nº de ref. del artículo: 3540279857-11-1
Cantidad disponible: 1 disponibles
Imagen de archivo
Powder Diffraction
Impresión bajo demandaLibrería: Biblios, Frankfurt am main, HESSE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. PRINT ON DEMAND pp. 236. Nº de ref. del artículo: 18296010
Cantidad disponible: 4 disponibles
Imagen del vendedor
Powder Diffraction
Publicado por
Springer, Berlin, Springer Berlin Heidelberg, Springer, 2005
ISBN 10: 3540279857
ISBN 13: 9783540279853
Nuevo
Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware - Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application. Nº de ref. del artículo: 9783540279853
Cantidad disponible: 2 disponibles