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Sinopsis
<P>SCANNING AND STATIONARY-BEAM ELECTRON MICROSCOPES ARE INDISPENSABLE TOOLS FOR BOTH RESEARCH AND ROUTINE EVALUATION IN MATERIALS SCIENCE, THE SEMICONDUCTOR INDUSTRY, NANOTECHNOLOGY AND THE BIOLOGICAL, FORENSIC, AND MEDICAL SCIENCES. THIS BOOK INTRODUCES CURRENT THEORY AND PRACTICE OF ELECTRON MICROSCOPY, PRIMARILY FOR UNDERGRADUATES WHO NEED TO UNDERSTAND HOW THE PRINCIPLES OF PHYSICS APPLY IN AN AREA OF TECHNOLOGY THAT HAS CONTRIBUTED GREATLY TO OUR UNDERSTANDING OF LIFE PROCESSES AND "INNER SPACE." PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY WILL APPEAL TO TECHNOLOGISTS WHO USE ELECTRON MICROSCOPES AND TO GRADUATE STUDENTS, UNIVERSITY TEACHERS AND RESEARCHERS WHO NEED A CONCISE REFERENCE ON THE BASIC PRINCIPLES OF MICROSCOPY.</P>
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Reseña del editor
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Contraportada
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
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- EditorialSpringer
- Año de publicación2016
- ISBN 10 3319398768
- ISBN 13 9783319398761
- EncuadernaciónTapa dura
- IdiomaInglés
- Número de edición2
- Número de páginas210
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Physical Principles of Electron Microscopy : An Introduction to Tem, Sem, and Aem
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Physical Principles of Electron Microscopy : An Introduction to Tem, Sem, and Aem
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Physical Principles of Electron Microscopy
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Springer International Publishing Jul 2016, 2016
ISBN 10: 3319398768
ISBN 13: 9783319398761
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy. 208 pp. Englisch. Nº de ref. del artículo: 9783319398761
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM
Publicado por
Springer International Publishing, 2016
ISBN 10: 3319398768
ISBN 13: 9783319398761
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy. Nº de ref. del artículo: 9783319398761
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Physical Principles of Electron Microscopy
Publicado por
Springer International Publishing, 2016
ISBN 10: 3319398768
ISBN 13: 9783319398761
Nuevo
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Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy Contains expanded reference lists as a launch point into the specialist literatureRequires on. Nº de ref. del artículo: 121215817
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Hardcover. Condición: New. 2nd ed. 2016. Special order direct from the distributor. Nº de ref. del artículo: ING9783319398761
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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