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Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro
Hardcover. Condición: new.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: Fine. Book is in Used-LikeNew condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear.
Publicado por Springer International Publishing Jul 2016, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy. 208 pp. Englisch.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Books Puddle, New York, NY, Estados Unidos de America
Libro
Condición: New. pp. 181.
Publicado por Springer International Publishing, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Thoroughly revised and updated from the popular 2005 edition, this textbook introduces both the theory and current practice of electron microscopy Contains expanded reference lists as a launch point into the specialist literatureRequires on.
Publicado por Springer International Publishing, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Libro
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Majestic Books, Hounslow, Reino Unido
Libro Impresión bajo demanda
Condición: New. Print on Demand pp. 181.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Russell Books, Victoria, BC, Canada
Libro
Hardcover. Condición: New. 2nd ed. 2016. Special order direct from the distributor.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Books Unplugged, Amherst, NY, Estados Unidos de America
Libro
Condición: Good. Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within.
Publicado por Springer Verlag, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Revaluation Books, Exeter, Reino Unido
Libro Impresión bajo demanda
Hardcover. Condición: Brand New. 2nd edition. 207 pages. 9.25x6.25x0.75 inches. This item is printed on demand.
Publicado por Springer, 2016
ISBN 10: 3319398768ISBN 13: 9783319398761
Librería: Mispah books, Redhill, SURRE, Reino Unido
Libro
Hardcover. Condición: Like New. Like New. book.