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Trace-Based Post-Silicon Validation for VLSI Circuits: 252 (Lecture Notes in Electrical Engineering) - Tapa dura
Sinopsis
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
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This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
· Provides a comprehensive summary of state-of-the-art on post-silicon validation;
· Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer;
· Illustrate key concepts and algorithms with real examples.
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Springer International Publishing, 2013
ISBN 10: 3319005324
ISBN 13: 9783319005324
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Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a comprehensive summary of state-of-the-art on post-silicon validationOffers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transferIllustrate key c. Nº de ref. del artículo: 4495871
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Springer International Publishing Jun 2013, 2013
ISBN 10: 3319005324
ISBN 13: 9783319005324
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. 124 pp. Englisch. Nº de ref. del artículo: 9783319005324
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Springer International Publishing, 2013
ISBN 10: 3319005324
ISBN 13: 9783319005324
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
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Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. Nº de ref. del artículo: 9783319005324
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Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252)
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Trace-Based Post-Silicon Validation for VLSI Circuits
Impresión bajo demandaLibrería: Majestic Books, Hounslow, Reino Unido
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Condición: New. Print on Demand pp. 126 59 Illus. (38 Col.). Nº de ref. del artículo: 94834448
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Springer International Publishing, Springer International Publishing Jun 2013, 2013
ISBN 10: 3319005324
ISBN 13: 9783319005324
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Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
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Buch. Condición: Neu. Neuware -This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 124 pp. Englisch. Nº de ref. del artículo: 9783319005324
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Trace-Based Post-Silicon Validation for VLSI Circuits
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Hardcover. Condición: Brand New. 2013 edition. 136 pages. 9.25x6.25x0.50 inches. In Stock. Nº de ref. del artículo: x-3319005324
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