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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics) - Tapa dura

Libro 13 de 17: Computational Microelectronics

Pichler, Peter

 
9783211206874: Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)

Sinopsis

This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.

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Reseña del editor

This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.

"Sobre este título" puede pertenecer a otra edición de este libro.