Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy - Tapa blanda

 
9781493939473: Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
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ISBN 10: 1493939475 ISBN 13: 9781493939473
Editorial: Springer, 2016

Sinopsis

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

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Acerca del autor

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

De la contraportada

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.Key Features: Serves the rapidly developing field of nanoscale characterization of functional materials properties Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization

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Editorial
Springer
Año de publicación
2016
Idioma
Inglés
ISBN 10 
1493939475
ISBN 13 
9781493939473
Encuadernación
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Número de páginas
576
Editor
Gruverman Alexei, Kalinin Sergei V.
Contacto del fabricante
Springer Nature Customer Service Center GmbH
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Heidelberg
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Alemania

Otras ediciones populares con el mismo título

9781441965677: Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

Edición Destacada

ISBN 10:  144196567X ISBN 13:  9781441965677
Editorial: Springer, 2010
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