IoT System Testing: An IoT Journey from Devices to Analytics and the Edge - Tapa blanda

Hagar, Jon Duncan

 
9781484282755: IoT System Testing: An IoT Journey from Devices to Analytics and the Edge
Tapa blanda
ISBN 10: 1484282752 ISBN 13: 9781484282755
Editorial: Apress, 2022

Sinopsis

To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion-of IoT-from a quality testing viewpoint.
 
You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI.
 
There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems.
 
What You Will Learn
  • Understand IoT software test architecture and planning
  • Master IoT security testing and test techniques
  • Study IoT test lab automation and architectures
  • Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V
 
Who This Book Is For
Readers with basic knowledge of software development who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book.

"Sinopsis" puede pertenecer a otra edición de este libro.

Acerca del autor

Jon Hagar is a senior tester with 40 years’ experience in software development and testing.  He has supported software product design, integrity, integration, reliability, measurement, verification, validation, and testing on various projects and software domains (environments).  He has an M.S. degree in Computer Science with specialization in Software Engineering and Testing from Colorado State University and a B.S. Degree in Math with specialization in Civil Engineering and Software from Metropolitan State College of Denver, Colorado.  Jon has worked in business analysis, systems, and software engineering, specializing in testing, verification and validation. Projects he has supported include the domains of embedded, mobile devices, IoT, PC/IT systems, and test lab and tool development. Currently, Jon works as a consultant for Grand Software Testing, LLC.Jon has taught hundreds of classes and tutorials in software engineering, systems engineering, and testing throughout the industry and universities.  He has published numerous articles on software reliability, testing, test tools, formal methods, mobile, and embedded systems.  He is the author of the book Software Test Attacks to Break Mobile and Embedded Devices and contributor to books on Agile testing and test automation.  Jon makes presentations regularly at industry working groups and conferences. Jon most recently has been working on: combinatorial testing, test automation, handheld-mobile devices, IoT security testing, and error taxonomies for IoT/embedded systems.

De la contraportada

To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion—of IoT—from a quality testing viewpoint.
 
You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI.
 
There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems.
 
You will:
  • Understand IoT software test architecture and planning
  • Master IoT security testing and test techniques
  • Study IoT test lab automation and architectures
  • Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Apress
Año de publicación
2022
Idioma
Inglés
ISBN 10 
1484282752
ISBN 13 
9781484282755
Encuadernación
Tapa blanda
Número de edición
1
Número de páginas
348
Contacto del fabricante
no disponible
Persona responsable
no disponible

Otras ediciones populares con el mismo título

9781484282779: IoT System Testing: An IoT Journey from Devices to Analytics and the Edge

Edición Destacada

ISBN 10:  1484282779 ISBN 13:  9781484282779
Editorial: Apress, 2022
Tapa blanda