Analog IC Reliability in Nanometer CMOS (Analog Circuits and Signal Processing) - Tapa dura

Libro 57 de 124: Analog Circuits and Signal Processing

Maricau, Elie; Gielen, Georges

 
9781461461623: Analog IC Reliability in Nanometer CMOS (Analog Circuits and Signal Processing)
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ISBN 10: 1461461626 ISBN 13: 9781461461623
Editorial: Springer, 2013

Sinopsis

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

"Sinopsis" puede pertenecer a otra edición de este libro.

De la contraportada

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

· Enables readers to understand long-term reliability of an integrated circuit;

· Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes;

· Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology;

· Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2013
Idioma
Inglés
ISBN 10 
1461461626
ISBN 13 
9781461461623
Encuadernación
Tapa dura
Número de páginas
216
Contacto del fabricante
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Otras ediciones populares con el mismo título

9781489986306: Analog IC Reliability in Nanometer CMOS (Analog Circuits and Signal Processing)

Edición Destacada

ISBN 10:  1489986308 ISBN 13:  9781489986306
Editorial: Springer, 2015
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