Artículos relacionados a Statistical Performance Analysis and Modeling Techniques...
Sinopsis
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.
This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.
- Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
- Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
- Presents analysis of each algorithm with practical applications in the context of real circuit design;
- Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
- Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
- Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
- Presents analysis of each algorithm with practical applications in the context of real circuit design;
- Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
"Sinopsis" puede pertenecer a otra edición de este libro.
De la contraportada
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.
This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.
- Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
- Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
- Presents analysis of each algorithm with practical applications in the context of real circuit design;
- Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
- Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
- Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
- Presents analysis of each algorithm with practical applications in the context of real circuit design;
- Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
"Sobre este título" puede pertenecer a otra edición de este libro.
Comprar nuevo
Ver este artículo
EUR 89,99
EUR 19,49 gastos de envío desde Alemania a España
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Statistical Performance Analysis and Modeling Techniques...
Imagen de archivo
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs.
Publicado por
New York, Springer New York., 2012
ISBN 10: 1461407877
ISBN 13: 9781461407874
Antiguo o usado
Tapa dura
Librería: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Alemania
Calificación del vendedor: 5 de 5 estrellas
XXIX, 305 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch. Nº de ref. del artículo: 1842BB
Cantidad disponible: 2 disponibles
Imagen de archivo
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Librería: Book Dispensary, Concord, ON, Canada
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: As New. BRAND NEW hardcover, minor shelf/handling wear. Book. Nº de ref. del artículo: 114989
Cantidad disponible: 1 disponibles
Imagen de archivo
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Publicado por
Springer New York, 2012
ISBN 10: 1461407877
ISBN 13: 9781461407874
Antiguo o usado
Tapa dura
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 11571261/1
Cantidad disponible: 1 disponibles
Imagen del vendedor
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Impresión bajo demandaLibrería: moluna, Greven, Alemania
Calificación del vendedor: 4 de 5 estrellas
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuitsHelps chip designers . Nº de ref. del artículo: 4196931
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Publicado por
Springer New York Mrz 2012, 2012
ISBN 10: 1461407877
ISBN 13: 9781461407874
Nuevo
Tapa dura
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in the context of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in the context of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 336 pp. Englisch. Nº de ref. del artículo: 9781461407874
Cantidad disponible: 2 disponibles
Imagen del vendedor
Statistical Performance Analysis and Modeling Techniques for Nanometer Vlsi Designs
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 14211081-n
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9781461407874_new
Cantidad disponible: Más de 20 disponibles
Imagen de archivo
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Librería: Best Price, Torrance, CA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: New. SUPER FAST SHIPPING. Nº de ref. del artículo: 9781461407874
Cantidad disponible: 1 disponibles
Imagen del vendedor
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Publicado por
Springer New York, Springer New York, 2012
ISBN 10: 1461407877
ISBN 13: 9781461407874
Nuevo
Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in the context of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in thecontext of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Nº de ref. del artículo: 9781461407874
Cantidad disponible: 1 disponibles
Imagen de archivo
Shen:Statistical Performance Analysis a (eng)
Impresión bajo demandaLibrería: Brook Bookstore On Demand, Napoli, NA, Italia
Calificación del vendedor: 5 de 5 estrellas
Condición: new. Questo è un articolo print on demand. Nº de ref. del artículo: 42d19731546a8d9515e78ae98ecd79e8
Cantidad disponible: Más de 20 disponibles