Built-in-Self-Test and Digital Self-Calibration for RF SoCs: 0 (SpringerBriefs in Electrical and Computer Engineering) - Tapa blanda

Bou-Sleiman, Sleiman

 
9781441995476: Built-in-Self-Test and Digital Self-Calibration for RF SoCs: 0 (SpringerBriefs in Electrical and Computer Engineering)
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ISBN 10: 1441995471 ISBN 13: 9781441995476
Editorial: Springer, 2011

Sinopsis

This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

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De la contraportada

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2011
Idioma
Inglés
ISBN 10 
1441995471
ISBN 13 
9781441995476
Encuadernación
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Número de páginas
108
Contacto del fabricante
no disponible
Persona responsable
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Alemania

Otras ediciones populares con el mismo título

9781441995490: Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Edición Destacada

ISBN 10:  1441995498 ISBN 13:  9781441995490
Editorial: Springer, 2011
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