Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology) - Tapa blanda

Foster, Adam; Hofer, Werner A.

 
9781441923066: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
Tapa blanda
ISBN 10: 1441923063 ISBN 13: 9781441923066
Editorial: Springer, 2010

Sinopsis

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.

 

Key Features

  • Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
  • Provides a framework for linking scanning probe theory and simulations with experimental data
  • Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

"Sinopsis" puede pertenecer a otra edición de este libro.

De la contraportada

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2010
Idioma
Inglés
ISBN 10 
1441923063
ISBN 13 
9781441923066
Encuadernación
Tapa blanda
Número de páginas
296
Contacto del fabricante
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Alemania

Otras ediciones populares con el mismo título

9780387400907: Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)

Edición Destacada

ISBN 10:  0387400907 ISBN 13:  9780387400907
Editorial: Springer, 2006
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