A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer’s perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
"Sobre este título" puede pertenecer a otra edición de este libro.
Librería: HPB-Red, Dallas, TX, Estados Unidos de America
hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Nº de ref. del artículo: S_388382090
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Librería: WeBuyBooks, Rossendale, LANCS, Reino Unido
hardcover. Condición: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned. Nº de ref. del artículo: rev4622631937
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Librería: Anybook.com, Lincoln, Reino Unido
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9781402070501. Nº de ref. del artículo: 8996639
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Librería: BennettBooksLtd, Los Angeles, CA, Estados Unidos de America
hardcover. Condición: New. In shrink wrap. Looks like an interesting title! Nº de ref. del artículo: Q-1402070500
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Librería: moluna, Greven, Alemania
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer s perspective and describes the major BIST approaches that have been proposed and implemented, a. Nº de ref. del artículo: 4094802
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations. 344 pp. Englisch. Nº de ref. del artículo: 9781402070501
Cantidad disponible: 2 disponibles
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Condición: New. Nº de ref. del artículo: 788551-n
Cantidad disponible: 15 disponibles
Librería: preigu, Osnabrück, Alemania
Buch. Condición: Neu. A Designer's Guide to Built-In Self-Test | Charles E. Stroud | Buch | Frontiers in Electronic Testing | xx | Englisch | 2002 | Springer US | EAN 9781402070501 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. Nº de ref. del artículo: 103202853
Cantidad disponible: 5 disponibles
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Condición: New. In English. Nº de ref. del artículo: ria9781402070501_new
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Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Condición: New. Written from a designer's perspective, this title describes the BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. It pays particular attention to system-level use of BIST in order to maximize benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. Series: Frontiers in Electronic Testing. Num Pages: 340 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 20. Weight in Grams: 1450. . 2002. Hardback. . . . . Nº de ref. del artículo: V9781402070501
Cantidad disponible: 15 disponibles