The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis.
"Sinopsis" puede pertenecer a otra edición de este libro.
N. Unnikrishnan Nair gained his Ph.D from the University of Kerala, India and was conferred the degree of Doctor of Humane Letters by Juniata College, USA. He is a Fellow of the Indian Society for Probability and Statistics and its past President. He was also a member of the International Statistical Institute. Nair was the Professor and Chair of the Department of Statistics of the Cochin University of Science and Technology, India, and Dean, Faculty of Science. He also served the University as its Vice Chancellor. He has published six books of which he is the leading author of two recent titles, Quantile-based Reliability Analysis by Birkhauser and Reliability Modeling and Analysis in Discrete Time by Academic Press. He has published over 170 papers in refereed international journals.
S.M. Sunoj gained his Ph.D from the Cochin University of Science and Technology, India. He is the Professor of Department of Statistics, Cochin University of Science and Technology. He has published over 65 papers in refereed international journals. He is an elected member of the International Statistical Institute. He is currently the Associate Editor of the Journal of the Indian Society for Probability and Statistics, India. His areas of research include distribution theory, reliability theory and information measures.
G. Rajesh is the Professor of the Department of Statistics, Cochin University of Science and Technology, India. He received his Ph.D from the Department of Statistics, Cochin University of Science and Technology, India. His main areas of research include distribution theory, information measures and non-parametric inferences. He has published more than 50 research papers in refereed international journals.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 2,27 gastos de envío en Estados Unidos de America
Destinos, gastos y plazos de envíoEUR 7,44 gastos de envío desde Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envíoLibrería: Majestic Books, Hounslow, Reino Unido
Condición: New. vii, 346 pages. Nº de ref. del artículo: 398688423
Cantidad disponible: 3 disponibles
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Condición: New. Nº de ref. del artículo: 48140532-n
Cantidad disponible: Más de 20 disponibles
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
Paperback. Condición: new. Paperback. The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis. This is an emerging area of study and research during the last two decades and is of potential interest in many fields. In this work the classical measures of uncertainty are sufficiently modified to meet the needs of lifetime data analysis. The book provides an exhaustive collection of materials in a single volume to make it a comprehensive source of reference.The first treatise on the subject. It brings together the work that have appeared in journals on different disciplines. It will serve as a text for graduate students and practioners of special studies in information theory, as well as statistics and as a reference book for researchers. The book contains illustrative examples, tables and figures for clarifying the concepts and methodologies, the book is self-contained. It helps students to access information relevant to careers in industry, engineering, applied statistics, etc. The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9781032314174
Cantidad disponible: 1 disponibles
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Condición: As New. Unread book in perfect condition. Nº de ref. del artículo: 48140532
Cantidad disponible: Más de 20 disponibles
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
PAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L0-9781032314174
Cantidad disponible: Más de 20 disponibles
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
PAP. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L0-9781032314174
Cantidad disponible: Más de 20 disponibles
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
Condición: New. Nº de ref. del artículo: 48140532-n
Cantidad disponible: Más de 20 disponibles
Librería: Books Puddle, New York, NY, Estados Unidos de America
Condición: New. vii, 346 pages First edition Includes bibliographical references and index. Nº de ref. del artículo: 26397688696
Cantidad disponible: 3 disponibles
Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
Paperback / softback. Condición: New. New copy - Usually dispatched within 4 working days. 653. Nº de ref. del artículo: B9781032314174
Cantidad disponible: 1 disponibles
Librería: Biblios, Frankfurt am main, HESSE, Alemania
Condición: New. vii, 346 pages. Nº de ref. del artículo: 18397688690
Cantidad disponible: 3 disponibles