Artículos relacionados a Interfacial Properties on the Submicrometer Scale:...

Interfacial Properties on the Submicrometer Scale: No.781 (ACS Symposium Series) - Tapa dura

 
9780841236912: Interfacial Properties on the Submicrometer Scale: No.781 (ACS Symposium Series)
Tapa dura
ISBN 10: 0841236917 ISBN 13: 9780841236912
Editorial: American Chemical Society, 2001

Sinopsis

This book deals with the increasingly 'diminishing' interfaces that are resulting as device dimensions scale down. Chapter topics include nanomechanical properties and stuctures of thin films in contrast to their bulk counterparts, from both experimental and theoretical perspectives; viscoelasticity, micro-roughness, and friction, particularly in polymers; advances in instrumentation such as scanning probes, X-ray scattering, sum frequency generation spectroscopy and nanorheometers; the origin of film properties via tailored molecular modification of film components; molecular dynamics simulations and modelling of interfaces.

"Sinopsis" puede pertenecer a otra edición de este libro.

Críticas

"This book features the proceedings from the American Chemical Society Symposium held in New Orleans, USA, in August 1999, and is particularly timely since many device technologies in microelectronics and biotechnology, such as the 'lab on chip' concept, require fundamental understanding of the properties of solids and fluids at interfaces as product dimensions move towards the nanoscale. . .The 'introductory' section (by the editors) gives an overview of the field by discussing interfacial constraints from geometrical and structural perspectives. . .This book is a good first step on the way to understanding the physics and chemistry of materials properties at the mesoscale, and recommended for library purchase in institutions with research groups working in this area."--Materials World

Reseña del editor

This book deals with the increasingly 'diminishing' interfaces that are resulting as device dimensions scale down. Chapter topics include nanomechanical properties and stuctures of thin films in contrast to their bulk counterparts, from both experimental and theoretical perspectives; viscoelasticity, micro-roughness, and friction, particularly in polymers; advances in instrumentation such as scanning probes, X-ray scattering, sum frequency generation spectroscopy and nanorheometers; the origin of film properties via tailored molecular modification of film components; molecular dynamics simulations and modelling of interfaces.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
American Chemical Society
Año de publicación
2001
Idioma
Inglés
ISBN 10 
0841236917
ISBN 13 
9780841236912
Encuadernación
Tapa dura
Número de páginas
236
Editor
Frommer Jane E., Overney Rene M.
Contacto del fabricante
no disponible
Persona responsable
no disponible