Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering) - Tapa dura

 
9780824785567: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)

Sinopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Acerca del autor

Lawrence E. Murr

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Otras ediciones populares con el mismo título

9780367402945: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)

Edición Destacada

ISBN 10:  0367402947 ISBN 13:  9780367402945
Editorial: CRC Press, 2019
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