Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels.
The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.
"Sinopsis" puede pertenecer a otra edición de este libro.
Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels.
The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 10,91 gastos de envío desde Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envíoEUR 7,65 gastos de envío en Estados Unidos de America
Destinos, gastos y plazos de envíoLibrería: PsychoBabel & Skoob Books, Didcot, Reino Unido
hardcover. Condición: Very Good. Estado de la sobrecubierta: No Dust Jacket. First Edition. White hardcover with white lettering on spine and upper board and contents in very good clean condition, showing minimal signs of wear. Previous owner's name on FEP. Profusely illustrated by diagrams and tables. No dust jacket. T. Used. Nº de ref. del artículo: 249216
Cantidad disponible: 1 disponibles
Librería: Buchpark, Trebbin, Alemania
Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 2297973/3
Cantidad disponible: 2 disponibles
Librería: Best Price, Torrance, CA, Estados Unidos de America
Condición: New. SUPER FAST SHIPPING. Nº de ref. del artículo: 9780792395805
Cantidad disponible: 1 disponibles
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Condición: New. Nº de ref. del artículo: ABLIING23Feb2416190186024
Cantidad disponible: Más de 20 disponibles
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Condición: New. In. Nº de ref. del artículo: ria9780792395805_new
Cantidad disponible: Más de 20 disponibles
Librería: Grand Eagle Retail, Mason, OH, Estados Unidos de America
Hardcover. Condición: new. Hardcover. A history of the development of simulation techniques, presenting a detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level and gate-level simulation. The text also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 examines the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodelling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address topics such as: the device model detail; transistor coupling capacitance; effective channel length modulation; series transistor reduction; effective transconductance; input terminal dependence; gate parasitic capacitance; the body effect; the impact of parasitic RC-interconnects; and the effect of transmission gates. Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9780792395805
Cantidad disponible: 1 disponibles
Librería: moluna, Greven, Alemania
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timi. Nº de ref. del artículo: 5971598
Cantidad disponible: Más de 20 disponibles
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Condición: New. 1995. Hardcover. . . . . . Nº de ref. del artículo: V9780792395805
Cantidad disponible: 15 disponibles
Librería: Books Puddle, New York, NY, Estados Unidos de America
Condición: New. pp. 292 Index. Nº de ref. del artículo: 26319980
Cantidad disponible: 4 disponibles
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Buch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels.The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 292 pp. Englisch. Nº de ref. del artículo: 9780792395805
Cantidad disponible: 1 disponibles