Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2) - Tapa blanda

Libro 4 de 241: NATO Science Series II: Mathematics, Physics and Chemistry
 
9780792366867: Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
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ISBN 10: 0792366867 ISBN 13: 9780792366867
Editorial: Springer, 2009

Sinopsis

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

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Reseña del editor

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
2009
Idioma
Inglés
ISBN 10 
0792366867
ISBN 13 
9780792366867
Encuadernación
Tapa blanda
Número de páginas
636
Editor
Pacchioni Gianfranco
Contacto del fabricante
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Alemania

Otras ediciones populares con el mismo título

9780792366850: Defects in SiO2 and Related Dielectrics: Science and Technology: 2 (NATO Science Series II: Mathematics, Physics and Chemistry, 2)

Edición Destacada

ISBN 10:  0792366859 ISBN 13:  9780792366850
Editorial: Springer, 2000
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