Semiconductor Memories: Technology, Testing, and Reliability - Tapa dura

Sharma, Ashok K.; IEEE; Sharma, MD Facp Facc

 
9780780310001: Semiconductor Memories: Technology, Testing, and Reliability
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ISBN 10: 0780310004 ISBN 13: 9780780310001
Editorial: John Wiley & Sons, 2002

Sinopsis

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

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Acerca del autor

ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
John Wiley & Sons
Año de publicación
2002
Idioma
Inglés
ISBN 10 
0780310004
ISBN 13 
9780780310001
Encuadernación
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Número de páginas
476
Contacto del fabricante
no disponible
Persona responsable
no disponible

Otras ediciones populares con el mismo título

9780471462439: Semiconductor Memories & Advanced Semiconductor Memories, 2 Volume Set

Edición Destacada

ISBN 10:  0471462438 ISBN 13:  9780471462439
Editorial: Wiley-IEEE Press, 2003
Tapa dura