Built-In Test For VLSI: Pseudorandom Techniques - Tapa dura

Bardell

 
9780471624639: Built-In Test For VLSI: Pseudorandom Techniques
Tapa dura
ISBN 10: 0471624632 ISBN 13: 9780471624639
Editorial: John Wiley & Sons, 1987

Sinopsis

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.

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Acerca del autor

Paul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
John Wiley & Sons
Año de publicación
1987
Idioma
Inglés
ISBN 10 
0471624632
ISBN 13 
9780471624639
Encuadernación
Tapa dura
Número de páginas
372
Contacto del fabricante
no disponible
Persona responsable
no disponible