Digital Speckle Pattern Interferometry and Related Techniques - Tapa dura

 
9780471490524: Digital Speckle Pattern Interferometry and Related Techniques

Sinopsis

Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.

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Acerca del autor

Pramod K. Rastogi is the author of Digital Speckle Pattern Interferometry and Related Techniques, published by Wiley.

De la contraportada

Digital Speckle Pattern Interferometry (DSPI) is the generic name for a class of important interferometric techniques such as TV holography, electronic holography or phase shifting pattern interferometry, all of which involve similar optical and electronic principles. These techniques are increasingly used in a wide range of fields including experimental mechanics, vibration analysis and non-destructive testing.
Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.
This is an invaluable text for practising engineers in industry and research institutes, and academic and development researchers in scientific and engineering disciplines who use, or are interested in, DSPI. This title would also be of interest to teachers and final year undergraduate/postsgraduate students of physics, optics, experiemental mechanics, photomechanics, optical metrology, engineering metrology, and non-destructive testing.

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