Advanced VLSI Design and Testability Issues - Tapa blanda

 
9780367538361: Advanced VLSI Design and Testability Issues
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ISBN 10: 0367538369 ISBN 13: 9780367538361
Editorial: CRC Press, 2022

Sinopsis

This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

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Acerca del autor

Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc.

Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits.

S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
CRC Press
Año de publicación
2022
Idioma
Inglés
ISBN 10 
0367538369
ISBN 13 
9780367538361
Encuadernación
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Número de edición
1
Número de páginas
378
Editor
Tripathi Suman Lata, Saxena Sobhit, Mohapatra Sushanta Kumar
Contacto del fabricante
no disponible
Persona responsable
no disponible

Otras ediciones populares con el mismo título

9780367492823: Advanced VLSI Design and Testability Issues

Edición Destacada

ISBN 10:  0367492822 ISBN 13:  9780367492823
Editorial: CRC Press, 2020
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