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Research for Practical Issues and Solutions in Computerized Multistage Testing - Tapa blanda

 
9780367207816: Research for Practical Issues and Solutions in Computerized Multistage Testing
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ISBN 10: 0367207818 ISBN 13: 9780367207816
Editorial: Routledge, 2024

Sinopsis

This volume presents a comprehensive collection of the latest research findings supporting the current and future implementations and applications of computerized multistage testing (MST).

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Acerca del autor

Duanli Yan is a Director of Computational Research at Educational Testing Services, Princeton, New Jersey, USA. She is also an adjunct professor at Rutgers University and Fordham University and has extensive experience in innovative psychometric research and development. She has published many books and received many awards, including the 2016 AERA D Significant Contribution to Educational Measurement and Research Methodology Award, and the 2022 and 2023 NCME Bradley Hanson Award.

Alina A. von Davier is the Chief of Assessment at Duolingo, Pittsburgh, Pennsylvania, USA. She leads the Duolingo English Test research and development area. She is a researcher in computational psychometrics, machine learning, and education. Von Davier is an innovator and an executive leader with over 20 years of experience in EdTech and in the assessment industry. In 2022, she joined the University of Oxford as an Honorary Research Fellow, and Carnegie Mellon University as a Senior Research Fellow.

David J. Weiss is a Professor of Psychology at University of Minnesota, Minnesota, USA. He has been continuously active in computerized adaptive testing (CAT) research since 1970, including hosting six international CAT conferences. He co-founded the International Association for Computerized Adaptive Testing, the Assessment Systems Corporation, and the Insurance Testing Corporation and was the founding editor of Applied Psychological Measurement and the Journal of Computerized Adaptive Testing.

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Editorial
Routledge
Año de publicación
2024
Idioma
Inglés
ISBN 10 
0367207818
ISBN 13 
9780367207816
Encuadernación
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Número de edición
1
Número de páginas
516
Editor
Yan Duanli, Von Davier Alina A., Weiss David J.
Contacto del fabricante
Taylor and Francis, GPSR Taylor and Francis
gpsr@taylorandfrancis.com

Taylor & Francis Verlag GmbH, Kaufingerstraße 24
München
80331
Alemania

Otras ediciones populares con el mismo título

9780367207809: Research for Practical Issues and Solutions in Computerized Multistage Testing

Edición Destacada

ISBN 10:  036720780X ISBN 13:  9780367207809
Editorial: Routledge, 2024
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