Artículos relacionados a Advanced Scanning Electron Microscopy and X-Ray Microanalysi...
Sinopsis
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
"Sinopsis" puede pertenecer a otra edición de este libro.
Reseña del editor
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con- tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro- ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan- ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol- ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol- ume, including those on magnetic contrast and electron channeling con- trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel- opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
"Sobre este título" puede pertenecer a otra edición de este libro.
- EditorialSpringer
- Año de publicación1986
- ISBN 10 0306421402
- ISBN 13 9780306421402
- EncuadernaciónTapa dura
- IdiomaInglés
- Número de páginas484
- Contacto del fabricanteno disponible
EUR 6,65
EUR 11,92 gastos de envío desde Estados Unidos de America a España
Destinos, gastos y plazos de envíoComprar nuevo
Ver este artículo
EUR 62,21
EUR 25,87 gastos de envío desde Estados Unidos de America a España
Destinos, gastos y plazos de envíoOtras ediciones populares con el mismo título
Resultados de la búsqueda para Advanced Scanning Electron Microscopy and X-Ray Microanalysi...
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 1.84. Nº de ref. del artículo: G0306421402I3N00
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Publicado por
Plenum Press, 1987
ISBN 10: 0306421402
ISBN 13: 9780306421402
Antiguo o usado
Tapa dura
Librería: Zubal-Books, Since 1961, Cleveland, OH, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Good. Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Nº de ref. del artículo: ZB1316271
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Publicado por
Springer US, 1986
ISBN 10: 0306421402
ISBN 13: 9780306421402
Antiguo o usado
Tapa dura
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Sehr gut. Zustand: Sehr gut | Seiten: 454 | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 2137772/2
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Publicado por
Springer, New York, NY, 1986
ISBN 10: 0306421402
ISBN 13: 9780306421402
Antiguo o usado
Tapa dura
Librería: West With The Night, Tucson, AZ, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hard cover. 1986 ed. Sewn binding. Cloth over boards. 454 p. Contains: Illustrations, black & white. Audience: General/trade. Very good. No dust jacket. light shelfwear po name inside cover. Nº de ref. del artículo: Alibris.0014568
Cantidad disponible: 1 disponibles
Imagen de archivo
ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
Librería: Basi6 International, Irving, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Nº de ref. del artículo: ABEJUNE24-71899
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Librería: Toscana Books, AUSTIN, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Nº de ref. del artículo: Scanned0306421402
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. pp. xii + 454. Nº de ref. del artículo: 26268197
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Librería: The Book Spot, Sioux Falls, MN, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Hardcover. Condición: New. Nº de ref. del artículo: Abebooks23736
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Publicado por
Plenum Press, 1986
ISBN 10: 0306421402
ISBN 13: 9780306421402
Antiguo o usado
Tapa dura
Librería: HPB-Red, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Nº de ref. del artículo: S_349912911
Cantidad disponible: 1 disponibles
Imagen de archivo
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Librería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. pp. xii + 454. Nº de ref. del artículo: 7579770
Cantidad disponible: 1 disponibles