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Detalles bibliogr�ficos

T�tulo: Testing of Digital Systems
Editor: Cambridge University Press
Fecha de publicaci�n: 2003
Idioma: Ingl�s
ISBN 10: 0521773563
ISBN 13: 9780521773560
Encuadernaci�n: Hardcover
Edici�n: 1st Edition.
Estado: New

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Sinopsis

The most comprehensive and wide ranging book on the testing of semiconductor devices and systems.

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Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, associate editor of IEEE Transactions on VLSI Systems and The Journal of Electronic Testing: Theory and Applications (JETTA) and a recipient of the AT&T Foundation award and the NEC preceptorship award for research excellence.

Sandeep Gupta is an Associate Professor in the Department of Electrical Engineering at the University of Southern California, USA. He is Co-Director of the M.S. Program in VLSI Design, with research interests in the area of VLSI testing and design. He is a member of the IEEE.

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