A fine copy in pictorial boards issued w/o a DJ. 1st edition with complete number line. Illustrated; Contents: Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References. 8vo., 213 pages. N� de ref. del art�culo 25028

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Detalles bibliogr�ficos

T�tulo: Principles of Semiconductor Network Testing ...

Editorial: Boston, MA: U.S.A.: Newnes / Butterworth Heinemann

A�o de publicaci�n: 1995

Encuadernaci�n: Hardcover

Condici�n: Fine

Condici�n de la sobrecubierta: No Jacket

Edici�n: 1st Edition

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Sinopsis:

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Rese�a del editor:

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
Best new source of information for experienced semiconductor engineers as well as entry-level personnel
Eight chapters about semiconductor testing

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