W/full markings and pocket. Wear, Soil. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Ex-Library Size: 4to.

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Detalles bibliogr�ficos

T�tulo

Integrated Circuit Metrology, Inspection, and Process Control, Proceedings of: Volume 775, 4-6 March 1987, Santa Clara, California, SPIE.

Editor

The International Society for Optical Engineering, Bellingham, WA, U.S.A.

Fecha de publicaci�n

1987

Idioma

Ingl�s

ISBN 10

0892528109

ISBN 13

9780892528103

Encuadernaci�n

Paperback

Edici�n

1st.

Estado

Very Good

Estado de la sobrecubierta

No Jacket

Tipo de libro

Ex-Library

Cat�logos de vendedores

OPTICS/OPTICAL

Descripci�n de la librer�a

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