VERY GOOD Unmarked PAGES And COVER And BINDING. Softback, AS SHOWN. Published/printed by North-Holland. 1988 printing. Approximately 6 X 9. 539 pages.

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Detalles bibliogr�ficos

T�tulo

Ellipsometry and Polarized Light (North-Holland Personal Library)

Editor

North Holland, Amsterdam

Fecha de publicaci�n

1988

Idioma

Ingl�s

ISBN 10

0444870164

ISBN 13

9780444870162

Encuadernaci�n

Soft cover

Edici�n

1st Edition

Estado

Very Good

Cat�logos de vendedores

Science, especially Physics snd Math.

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Sinopsis

Ellipsometry is a unique optical technique of great sensitivity for in situ non-destructive characterization of surface (inter-facial) phenomena (reactions) utilizing the change in the state of polarization of a light-wave probe. Although known for almost a century, the use of ellipsometry has increased rapidly in the last two decades. Among the most significant recent developments are new applications, novel and automated instrumentation and techniques for error-free data analysis. This book provides the necessary analytical and experimental tools needed for competent understanding and use of these developments. It is directed to those who are already working in the field and, more importantly, to the newcomer who would otherwise have to sift through several hundred published papers. The authors first present a comprehensive study of the different mathematical representations of polarized light and how such light is processed by optical systems, going on to show how these tools are applied to the analysis of ellipsometer systems. To relate ellipsometric measurements to surface properties, use is then made of electromagnetic theory.

Cr�ticas

(The authors) are to be commended on the further, major contribution to polarized light and its applications represented by this excellent book. Physics TodayThis book is carefully done... a serious and thorough effort that can be recommended to the expert in the field and the newcomer. Applied Optics

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Superbbooks
CA, U.S.A.

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