CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies
Pavlov, Andrei; Sachdev, Manoj
ISBN 10: 904817855X ISBN 13: 9789048178551
Editorial: Springer, 2010
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Descripción
Descripción:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2010. 1st ed. Softcover of orig. ed. 2008. Paperback. . . . . N° de ref. del artículo V9789048178551
Sinopsis:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
Acerca del autor: Prof. Sachdev has authored several successful books with Springer
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Detalles bibliográficos
Título: CMOS SRAM Circuit Design and Parametric Test...
Editorial: Springer
Año de publicación: 2010
Encuadernación: Encuadernación de tapa blanda
Condición: New
Edición: 1ª Edición
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)
Publicado por
Springer, Dordrecht, 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551
Nuevo
Paperback
Original o primera edición
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: new. Paperback. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9789048178551
Cantidad disponible: 1 disponibles
Imagen de archivo
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)
Publicado por
Springer, Dordrecht, 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551
Nuevo
Paperback
Original o primera edición
Librería: AussieBookSeller, Truganina, VIC, Australia
Calificación del vendedor: 5 de 5 estrellas
Paperback. Condición: new. Paperback. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Nº de ref. del artículo: 9789048178551
Cantidad disponible: 1 disponibles