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Añadir al carritoCondición: Good. Light wear to boards. Content is clean and bright. Good DJ. Small name to endpaper.
Idioma: Inglés
Publicado por Chapman & Hall LTD., London, 1975
ISBN 10: 0412142902 ISBN 13: 9780412142901
Librería: PsychoBabel & Skoob Books, Didcot, Reino Unido
Original o primera edición
EUR 18,91
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Añadir al carritoHardcover. Condición: Good. Estado de la sobrecubierta: No Dust Jacket. First Edition. Green cover with silver gilt lettering to spine has 4 cm tear along the edge of spine. Contents in very good clean condition. Library plate on front inside cover. Library stamp on prelims, some pages (with no obstruction of text), back inside cover and top of page block. Illustrated with diagrams and tables. Ex-Library.
Idioma: Inglés
Publicado por London, Chapman and Hall, 1975
ISBN 10: 0470054670 ISBN 13: 9780470054673
Librería: Antiquariat Bookfarm, Löbnitz, Alemania
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Añadir al carritoHardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ancien Exemplaire de bibliothèque avec signature et cachet. BON état, quelques traces d'usure. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. 62 BAR 9780470054673 Sprache: Englisch Gewicht in Gramm: 250.
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
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Añadir al carritohardcover. Condición: Befriedigend. Seiten; 9780470054673.4 Gewicht in Gramm: 1.
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Añadir al carritoCondición: New. In.
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Añadir al carritoPaperback. Condición: New.
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Añadir al carritoCondición: New. pp. 106.
Librería: Imaginal Books, Sardent, Francia
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Añadir al carritoHardcover. Condición: Very Good. Estado de la sobrecubierta: Very Good. 1st Edition. Monographs on applied probability and statistics.
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.
Publicado por London: Chapman and Hall, 1975., 1975
Librería: Librería Antonio Castro, SEVILLA, SE, España
EUR 14,40
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Añadir al carritoPrimera edición. 4to. 90pp. Encuadernación en tela editorial con sobrecubierta. Excelente estado. First edition. In original cloth with dustjacket. Excellent copy.
Librería: Majestic Books, Hounslow, Reino Unido
EUR 73,60
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Añadir al carritoCondición: New. Print on Demand pp. 106 22:B&W 5.5 x 8.5 in or 216 x 140 mm (Demy 8vo) Perfect Bound on White w/Gloss Lam.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
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Añadir al carritoCondición: New. PRINT ON DEMAND pp. 106.
Librería: moluna, Greven, Alemania
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Añadir al carritoCondición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribu.
Idioma: Inglés
Publicado por Springer Netherlands Nov 2013, 2013
ISBN 10: 9400957572 ISBN 13: 9789400957572
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 85,55
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes. 104 pp. Englisch.
Idioma: Inglés
Publicado por Springer Netherlands, Springer Netherlands Nov 2013, 2013
ISBN 10: 9400957572 ISBN 13: 9789400957572
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 53,49
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Añadir al carritoTaschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In a contribution (Bartlett, 1971 a) to the Symposium on Statistical Ecology at Yale in 1969, I noted in my introductory remarks that that paper was not intended to be in any way a review of statistical techniques for analysing spatial patterns. My contribution to a conference at Sheffield in 1973 aimed, at least in part, to supply such a review and forms the basis of this monograph; but in these prefatory remarks I must still make clear what I decided to discuss, and what I have omitted. Broadly speaking, the coverage is that included in seminars and lectures I have given on this theme since 1969. We may divide problems of spatial pattern (in contrast with complete random chaos) into (i) detecting departures from randomness, Oi) analysing such departures when detected, for example, in relation to some stochastic model and (iii) special problems which require separate consideration; for example, sophisticated problems of pattern recognition in specific fields, such as the computer reading of handwriting or recognition of chromosomes.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 104 pp. Englisch.
Librería: preigu, Osnabrück, Alemania
EUR 50,25
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Añadir al carritoTaschenbuch. Condición: Neu. The Statistical Analysis of Spatial Pattern | M. S. Bartlett | Taschenbuch | x | Englisch | 2013 | Springer Netherland | EAN 9789400957572 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.