Tipo de artículo
Condición
Encuadernación
Más atributos
Ubicación del vendedor
Valoración de los vendedores
Publicado por Springer, 2013
ISBN 10: 1475763107ISBN 13: 9781475763102
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro
Soft Cover. Condición: new.
Publicado por Springer, 1995
ISBN 10: 0412711605ISBN 13: 9780412711602
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro
Hardcover. Condición: new.
Publicado por Springer, 2013
ISBN 10: 1475763107ISBN 13: 9781475763102
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 1995
ISBN 10: 0412711605ISBN 13: 9780412711602
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 1995
ISBN 10: 0412711605ISBN 13: 9780412711602
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 2013
ISBN 10: 1475763107ISBN 13: 9781475763102
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer US, 2013
ISBN 10: 1475763107ISBN 13: 9781475763102
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Libro
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is the Proceedings of the 7th IFIP WG6.1 International Workshop on Protocol Test Systems (IWPTS'94) which was held in Tokyo, Japan on November 8-10, 1994. After having been organized in Vancouver (Canada, 1988), Berlin (Germany, 1989), McLean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992) and Pau (France, 1993), this is the 7th international workshop. The aim of the workshop is to be a meeting point between research and industry and between theory and practice of the testing of data communication systems. The workshop consists of the presentations of reviewed and invited papers, tool demonstrations and panel sessions. All submitted papers have been reviewed by the members of the Program Committee and the following additional reviewers including: L. Andrey, N. Arakawa, D. Becam, L. Boullier, R. Dssouli, B. Forghani, M. Higuchi, L. Heerink, G. Huecas, M. Hunter, S. lisaku, Y. Kakuda, K. Kazama, L-S. Koh , R. Langerak, D. Lee, G. Leon, G. Luo, P. Maigron, M. Mori, A. Nakamura, S. Nightingale, K. Okada, K. Okano, N. Okazaki, A. Petrenko, M. Phalippou, A. Rennoch, F. Sato, Y. Sugito, D. Tang, D. Toggweiler, F. Vallo and J. Zhu. The Program Committee has selected excellent papers among them. This proceedings includes two invited papers, fifteen regular papers, six short papers, two panel reports and one panel paper which were presented in the workshop.
Publicado por Springer US, 1995
ISBN 10: 0412711605ISBN 13: 9780412711602
Librería: moluna, Greven, Alemania
Libro
Gebunden. Condición: New. Part One. Open issues in conformance test specification. OSI protocol testing system based on user friendly test scenario specification functions. TTCN test case correctness validation. Invited Address 1. Fault coverage of tests based on finite state .
Publicado por Springer, 1995
ISBN 10: 0412711605ISBN 13: 9780412711602
Librería: Mispah books, Redhill, SURRE, Reino Unido
Libro
Hardcover. Condición: Like New. Like New. book.