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Añadir al carritoCondición: New. pp. 202 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de America
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Librería: Biblios, Frankfurt am main, HESSE, Alemania
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Librería: SMASS Sellers, IRVING, TX, Estados Unidos de America
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Añadir al carritoCondición: Brand New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Librería: ALLBOOKS1, Direk, SA, Australia
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Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de America
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Librería: Basi6 International, Irving, TX, Estados Unidos de America
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Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
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Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Librería: GreatBookPricesUK, Woodford Green, Reino Unido
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Añadir al carritoGebunden. Condición: New. Includes the latest studies/statistics on both verification complexity and design failuresProvides a complete view of the existing specification languages for programmable architecturesDemonstrates the development of functional fault models.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 109,94
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Añadir al carritoTaschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.
Librería: Mispah books, Redhill, SURRE, Reino Unido
EUR 168,02
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Añadir al carritoPaperback. Condición: Like New. Like New. book.
Librería: Buchpark, Trebbin, Alemania
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Añadir al carritoCondición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 162,93
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Añadir al carritoBuch. Condición: Neu. Neuware - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.
Publicado por Springer, 2005
Librería: Books in my Basket, New Delhi, India
EUR 122,71
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Añadir al carritoHardcover. Condición: New. ISBN:9780387261430.