fault tolerant fault testable hardware design de lala parag (4 resultados)

Softcover. Condición: Très bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Couverture différente. Edition 1985. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisat ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1985. Ammareal gives back up to 15% of this item's net price to charity organizations.

Paperback. Condición: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 1.3.

Paperback. Condición: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 1.3.

Soft cover. Condición: New. Contents 1. Basic concepts of reliability. 2. Faults in digital circuits. 3. Test generation. 4. Fault tolerant design of digital systems. 5. Self checking and fail safe logic. 6. Design for testability. 7. Conclusion. Appendix Markov Models. Reference. Annotated bibliography. Index. Fault Tolerance and Testability have the common objective of improving the reliability of computer hardware. This book has been written for the students of Electrical Engineering and Computer Sciences. Chapter 1 deals with the basics of reliability theory chapter 2 covers most of the important faults chapter 3 about fault detection chapter 4 discusses many classes of hardware fault tolerance techniques chapter 5 presents recent developments chapter 6 focuses on various design techniques and chapter 7 highlights the current research issues. The entire text is prepared in lucid language with sufficient basic techniques and examples for easy understanding. Features A systematic study of the various fault tolerant architectures in use. An in depth review of the basic characteristics of self checking logic detailed descriptions of all the major hardware techniques that may be used in fault tolerant and testable design. Comparisons of the various possible techniques for dealing with a problem and assessment of their suitability in various situations. Sections on the fault tolerant design of VLSI chips and state of the art problems still being researched over 200 line drawings and tables. Extensive references at the end of each chapter to facilitate further reading on specialist topics. An annotated bibliography listing textbooks journal articles and conference proceedings on the subject. 264 pp.