Electromagnetic testing (118 resultados)

Paperback. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condición: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.

Hardcover. New York: MacMillan Company: 1923, Volumes 1 (direct currents) and 2 (alternating currents) Volume 2 printed in 1911. Both volumes have light wear, volume 2 is more faded than volume 1. Pages browning. VG.; enstew1915.

hardcover. Condición: Very Good. Light edge wear, text is unmarked.

Condición: New.

Hardback or Cased Book. Condición: New. Electromagnetic Nondestructive Testing. Book.

Condición: As New. Unread book in perfect condition.

Condición: New.

Hardback. Condición: New.

Paperback. Condición: New. Print on Demand. This book explores the feasibility of using a near-field phased array for electromagnetic susceptibility testing. The author's goal is to find a way to control the electromagnetic fields produced by an array of antennas to generate a uniform plane wave within a specific test volume. The book develops a theoretical framework for this task, considering a range of array geometries and examining the effects of element spacing and tapering. The author explores how the techniques of array synthesis, similar to those used for predicting far-field antenna patterns, can be applied to generate a highly controlled near-field environment. The book examines the potential advantages of using near-field arrays for susceptibility testing, highlighting the potential for greater control over the test environment and the ability to scan the angle of arrival of the electromagnetic waves. The authorââ â¢s research provides insights into the complex relationship between source distributions, array geometry, and the resulting electromagnetic fields, paving the way for more efficient and accurate electromagnetic susceptibility testing. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item.…

Condición: New.

Couverture souple. Condición: bon. R200109240: 2000. In-8. Broché. Bon état, Couv. convenable, Dos satisfaisant, Intérieur frais. 199 pages. . . . Classification Dewey : 996-Autres régions du pacifique.

Condición: New.

Condición: New. In English.

paperback. Condición: New. Paperback. Pub Date :2013-11-01 Pages: 249 Language: Chinese Publisher: Electronic Industry Press Basic information Title : Electromagnetic compatibility and system testing technology machine Price: 48 yuan Author: Publisher : Electronic Industry Press Publication Date : November 1. 2013 ISBN: 9787121215810 words: pages : 249 Edition : 1st Edition Binding: Paperback : Weight : 522 g editor's Choice Electromagnetic compatibility and system testing machine technology by the Shangkai Ming editor. …

Condición: As New. Unread book in perfect condition.

Soft cover. Condición: New. Language:Chinese.Author:ZHONG GUO BIAO ZHUN CHU BAN SHE.Binding:Soft cover.Publisher:Standards Press of China; 1 (December 1. 2009).

paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 253 Publisher: Tsinghua University Press This book systematically discusses the electromagnetic environment and electromagnetic compatibility. design. interference and test technology. The book is divided into 9 chapters. Chapter 1 explains the basic concepts of electromagnetic compatibility and commonly used measurement units and test numerical processing methods; Chapter 2 introduces the basic knowledge of signal spectrum; Chapter 3 intro.…

Condición: New.

Hardback. Condición: New.

Condición: New.

paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2025-08 Pages: 232 Publisher: China Machine Press This book provides a brief introduction to laboratory accreditation. the development history of EMC testing laboratories. and the basic accreditation process. Combining practical experience in EMC testing laboratory accreditation. it elucidates key accreditation points and main methods for quality improvement. Furthermore. based on the development trends of EMC testing technology. it provides a detailed in.…

Condición: New.