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Añadir al carritoCondición: New. 268 pp., hardcover, new. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.
Idioma: Inglés
Publicado por Springer International Publishing, Springer Nature Switzerland Jan 2025, 2025
ISBN 10: 3031756525 ISBN 13: 9783031756528
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Añadir al carritoBuch. Condición: Neu. Neuware -This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
Idioma: Inglés
Publicado por Springer Nature Switzerland, Springer Nature Switzerland, 2025
ISBN 10: 3031756525 ISBN 13: 9783031756528
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 139,09
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging.
Librería: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 110,26
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Añadir al carritoCondición: new. Questo è un articolo print on demand.
Idioma: Inglés
Publicado por Springer, Berlin, Springer Nature Switzerland, Springer, 2025
ISBN 10: 3031756525 ISBN 13: 9783031756528
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 139,09
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Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging. 261 pp. Englisch.
Idioma: Inglés
Publicado por Springer Nature Switzerland, 2025
ISBN 10: 3031756525 ISBN 13: 9783031756528
Librería: preigu, Osnabrück, Alemania
EUR 123,00
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Añadir al carritoBuch. Condición: Neu. Deep Learning for Advanced X-ray Detection and Imaging Applications | Krzysztof Iniewski (u. a.) | Buch | vii | Englisch | 2025 | Springer Nature Switzerland | EAN 9783031756528 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.